Effects of Thermal Annealing for Barium and Silicon-Added Bismuth Based Zinc Oxide Varistors on Electrical Properties and Grain Boundary Structure: Fid-Bau Portal

Effects of Thermal Annealing for Barium and Silicon-Added Bismuth Based Zinc Oxide Varistors on Electrical Properties and Grain Boundary Structure

Kubota, A. / Sato, Y. / Yoshikado, S.

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Effects of Thermal Annealing for Barium and Silicon-Added Bismuth Based Zinc Oxide Varistors on Electrical Properties and Grain Boundary Structure

Kubota, A. / Sato, Y. / Yoshikado, S.

Effects of Thermal Annealing for Barium and Silicon-Added Bismuth Based Zinc Oxide Varistors on Electrical Properties and Grain Boundary Structure

Kubota, A. / Sato, Y. / Yoshikado, S.

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Check availability in my library

Order at Subito €

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Document information

Title:

Effects of Thermal Annealing for Barium and Silicon-Added Bismuth Based Zinc Oxide Varistors on Electrical Properties and Grain Boundary Structure

Contributors:

Kubota, A. (author) / Sato, Y. (author) / Yoshikado, S. (author) / Murayama, N. / Shinozaki, K. / Mizoguchi, T.

Published in:

Electroceramics in Japan XVI Selected, peer reviewed papers from the 32^n^d Electronics Division Meeting of the Ceramic Society of Japan, October 26-27, 2012, Tokyo, Japan ; 218-222

KEY ENGINEERING MATERIALS ; 582

Publication date:

2014-01-01

Size:

5 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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