Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Spectroscopic Proof of the Correlation between Redox-State and Charge-Carrier Transport at the Interface of Resistively Switching Ti/PCMO Devices

    New search for: Herpers, A.
    New search for: Lenser, C.
    New search for: Park, C.
    New search for: Offi, F.
    New search for: Borgatti, F.
    New search for: Panaccione, G.
    New search for: Menzel, S.
    New search for: Waser, R.
    New search for: Dittmann, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Spectroscopic Proof of the Correlation between Redox-State and Charge-Carrier Transport at the Interface of Resistively Switching Ti/PCMO Devices

    New search for: Herpers, A.
    New search for: Lenser, C.
    New search for: Park, C.
    New search for: Offi, F.
    New search for: Borgatti, F.
    New search for: Panaccione, G.
    New search for: Menzel, S.
    New search for: Waser, R.
    New search for: Dittmann, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic Proof of the Correlation between Redox-State and Charge-Carrier Transport at the Interface of Resistively Switching Ti/PCMO Devices

    New search for: Herpers, A.
    New search for: Lenser, C.
    New search for: Park, C.
    New search for: Offi, F.
    New search for: Borgatti, F.
    New search for: Panaccione, G.
    New search for: Menzel, S.
    New search for: Waser, R.
    New search for: Dittmann, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Spectroscopic Proof of the Correlation between Redox-State and Charge-Carrier Transport at the Interface of Resistively Switching Ti/PCMO Devices

    Contributors:

    Herpers, A. (author) / Lenser, C. (author) / Park, C. (author) / Offi, F. (author) / Borgatti, F. (author) / Panaccione, G. (author) / Menzel, S. (author) / Waser, R. (author) / Dittmann, R. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 26 ; 2730-2735

    Publication date:

    2014-01-01

    Size:

    6 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    The role of defects in resistively switching chalcogenides

    Waser, R. / Dittmann, R. / Salinga, M. et al. | British Library Online Contents | 2010

    FIRE RESISTIVELY COATED BEAM

    ONOKI TAKESHI / KIMURA KEI / SATO KEIICHI et al. | European Patent Office | 2023

    Free access

    Structural vibration control using resistively shunted piezoceramics

    Kandagal, S. B. / Venkatraman, K. | British Library Online Contents | 2002

    Finite element modelling of passive damping with resistively shunted piezocomposites

    Poizat, C. / Sester, M. | British Library Online Contents | 2000

    Correlation between interface state properties and electron transport at ultrathin insulator/Si interfaces

    Shiozawa, T. / Yoshida, T. / Hashizume, T. et al. | British Library Online Contents | 2000

    Back to top