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Electronic structure and metallization effects at threading dislocation cores in GaN
Electronic structure and metallization effects at threading dislocation cores in GaN
Electronic structure and metallization effects at threading dislocation cores in GaN
Belabbas, I. (author) / Chen, J. (author) / Nouet, G. (author)
COMPUTATIONAL MATERIALS SCIENCE ; 90 ; 71-81
2014-01-01
11 pages
Article (Journal)
English
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