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    Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures

    New search for: Han, J.
    New search for: Ouyang, L.
    New search for: Zhuang, D.
    New search for: Liao, C.
    New search for: Liu, J.
    New search for: Zhao, M.
    New search for: Cha, L. m.
    New search for: Besland, M. P.

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    Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures

    New search for: Han, J.
    New search for: Ouyang, L.
    New search for: Zhuang, D.
    New search for: Liao, C.
    New search for: Liu, J.
    New search for: Zhao, M.
    New search for: Cha, L. m.
    New search for: Besland, M. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures

    New search for: Han, J.
    New search for: Ouyang, L.
    New search for: Zhuang, D.
    New search for: Liao, C.
    New search for: Liu, J.
    New search for: Zhao, M.
    New search for: Cha, L. m.
    New search for: Besland, M. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures

    Contributors:

    Han, J. (author) / Ouyang, L. (author) / Zhuang, D. (author) / Liao, C. (author) / Liu, J. (author) / Zhao, M. (author) / Cha, L. m. (author) / Besland, M. P. (author)

    Published in:

    MATERIALS LETTERS ; 136 ; 278-281

    Publication date:

    2014-01-01

    Size:

    4 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105 / 530

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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