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    Reassessment of degradation mechanisms in anodic tantalum oxide capacitors under high electric fields

    New search for: Su, X.
    New search for: Viste, M.
    New search for: Hossick-Schott, J.
    New search for: Yang, L.
    New search for: Sheldon, B. W.

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    Reassessment of degradation mechanisms in anodic tantalum oxide capacitors under high electric fields

    New search for: Su, X.
    New search for: Viste, M.
    New search for: Hossick-Schott, J.
    New search for: Yang, L.
    New search for: Sheldon, B. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Reassessment of degradation mechanisms in anodic tantalum oxide capacitors under high electric fields

    New search for: Su, X.
    New search for: Viste, M.
    New search for: Hossick-Schott, J.
    New search for: Yang, L.
    New search for: Sheldon, B. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Reassessment of degradation mechanisms in anodic tantalum oxide capacitors under high electric fields

    Contributors:

    Su, X. (author) / Viste, M. (author) / Hossick-Schott, J. (author) / Yang, L. (author) / Sheldon, B. W. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 50 ; 960-969

    Publication date:

    2015-01-01

    Size:

    10 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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