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    Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method

    New search for: Yoon, J.
    New search for: Park, C.
    New search for: Park, S.
    New search for: Mun, B. S.
    New search for: Ju, H.

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    Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method

    New search for: Yoon, J.
    New search for: Park, C.
    New search for: Park, S.
    New search for: Mun, B. S.
    New search for: Ju, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method

    New search for: Yoon, J.
    New search for: Park, C.
    New search for: Park, S.
    New search for: Mun, B. S.
    New search for: Ju, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method

    Contributors:

    Yoon, J. (author) / Park, C. (author) / Park, S. (author) / Mun, B. S. (author) / Ju, H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 353 ; 1082-1086

    Publication date:

    2015-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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