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    Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

    New search for: Schmiedova, V.
    New search for: Heinrichova, P.
    New search for: Zmeskal, O.
    New search for: Weiter, M.

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    Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

    New search for: Schmiedova, V.
    New search for: Heinrichova, P.
    New search for: Zmeskal, O.
    New search for: Weiter, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

    New search for: Schmiedova, V.
    New search for: Heinrichova, P.
    New search for: Zmeskal, O.
    New search for: Weiter, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

    Contributors:

    Schmiedova, V. (author) / Heinrichova, P. (author) / Zmeskal, O. (author) / Weiter, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 349 ; 582-588

    Publication date:

    2015-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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