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    Atomic dynamics of grain boundaries in bulk nanocrystalline aluminium: A molecular dynamics simulation study

    New search for: Hou, Z. Y.
    New search for: Tian, Z. A.
    New search for: Mo, Y. F.
    New search for: Liu, R. S.
    New search for: Wang, J. G.
    New search for: Shuai, X. M.
    New search for: Dong, K. J.

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    Atomic dynamics of grain boundaries in bulk nanocrystalline aluminium: A molecular dynamics simulation study

    New search for: Hou, Z. Y.
    New search for: Tian, Z. A.
    New search for: Mo, Y. F.
    New search for: Liu, R. S.
    New search for: Wang, J. G.
    New search for: Shuai, X. M.
    New search for: Dong, K. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atomic dynamics of grain boundaries in bulk nanocrystalline aluminium: A molecular dynamics simulation study

    New search for: Hou, Z. Y.
    New search for: Tian, Z. A.
    New search for: Mo, Y. F.
    New search for: Liu, R. S.
    New search for: Wang, J. G.
    New search for: Shuai, X. M.
    New search for: Dong, K. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Atomic dynamics of grain boundaries in bulk nanocrystalline aluminium: A molecular dynamics simulation study

    Contributors:

    Hou, Z. Y. (author) / Tian, Z. A. (author) / Mo, Y. F. (author) / Liu, R. S. (author) / Wang, J. G. (author) / Shuai, X. M. (author) / Dong, K. J. (author)

    Published in:

    COMPUTATIONAL MATERIALS SCIENCE ; 108 ; 177-182

    Publication date:

    2015-01-01

    Size:

    6 pages

    ISSN:

    0927-0256

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1 / 510

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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