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In situ monitoring and ex situ TEM analyses of spinel (MgAl Formula Not Shown O Formula Not Shown ) growth between (111)-oriented periclase (MgO) substrates and Al Formula Not Shown O Formula Not Shown thin films
In situ monitoring and ex situ TEM analyses of spinel (MgAl Formula Not Shown O Formula Not Shown ) growth between (111)-oriented periclase (MgO) substrates and Al Formula Not Shown O Formula Not Shown thin films
In situ monitoring and ex situ TEM analyses of spinel (MgAl Formula Not Shown O Formula Not Shown ) growth between (111)-oriented periclase (MgO) substrates and Al Formula Not Shown O Formula Not Shown thin films
Götze, L. C. (author) / Milke, R. (author) / Zizak, I. (author) / Wirth, R. (author)
JOURNAL OF MATERIALS SCIENCE ; 51 ; 8824-8844
2016-01-01
21 pages
Article (Journal)
English
DDC:
620.11
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