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    Studying the dependence of flaw-induced magnetic field on the parameters of magnetizing device

    New search for: Novikov, I. A.
    New search for: Pokrovskii, A. D.

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    Studying the dependence of flaw-induced magnetic field on the parameters of magnetizing device

    New search for: Novikov, I. A.
    New search for: Pokrovskii, A. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Studying the dependence of flaw-induced magnetic field on the parameters of magnetizing device

    New search for: Novikov, I. A.
    New search for: Pokrovskii, A. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Studying the dependence of flaw-induced magnetic field on the parameters of magnetizing device

    Contributors:

    Novikov, I. A. (author) / Pokrovskii, A. D. (author)

    Published in:

    RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING C/C OF DEFEKTOSKOPIIA ; 52 ; 409-414

    Publication date:

    2016-01-01

    Size:

    6 pages

    ISSN:

    1061-8309

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1127

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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