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Higher order Cauchy–Born rule based multiscale cohesive zone model and prediction of fracture toughness of silicon thin films

Urata, S. / Li, S.

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Higher order Cauchy–Born rule based multiscale cohesive zone model and prediction of fracture toughness of silicon thin films

Urata, S. / Li, S.

Higher order Cauchy–Born rule based multiscale cohesive zone model and prediction of fracture toughness of silicon thin films

Urata, S. / Li, S.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Higher order Cauchy–Born rule based multiscale cohesive zone model and prediction of fracture toughness of silicon thin films

Contributors:

Urata, S. (author) / Li, S. (author)

Published in:

INTERNATIONAL JOURNAL OF FRACTURE ; 203 ; 159-181

Publication date:

2017-01-01

Size:

23 pages

ISSN:

0376-9429

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1126

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