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    Transmission electron microscopy studies of structural degradation behavior of LiNi0.6Co0.2Mn0.2O2 cathode materials

    New search for: Yun, H. S.
    New search for: Lee, S. H.
    New search for: Cho, N. H.
    New search for: Lee, D. J.
    New search for: Jeon, H. L.
    New search for: Park, S. Y.
    New search for: Jeong, W. M.

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    Transmission electron microscopy studies of structural degradation behavior of LiNi0.6Co0.2Mn0.2O2 cathode materials

    New search for: Yun, H. S.
    New search for: Lee, S. H.
    New search for: Cho, N. H.
    New search for: Lee, D. J.
    New search for: Jeon, H. L.
    New search for: Park, S. Y.
    New search for: Jeong, W. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Transmission electron microscopy studies of structural degradation behavior of LiNi0.6Co0.2Mn0.2O2 cathode materials

    New search for: Yun, H. S.
    New search for: Lee, S. H.
    New search for: Cho, N. H.
    New search for: Lee, D. J.
    New search for: Jeon, H. L.
    New search for: Park, S. Y.
    New search for: Jeong, W. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Transmission electron microscopy studies of structural degradation behavior of LiNi0.6Co0.2Mn0.2O2 cathode materials

    Contributors:

    Yun, H. S. (author) / Lee, S. H. (author) / Cho, N. H. (author) / Lee, D. J. (author) / Jeon, H. L. (author) / Park, S. Y. (author) / Jeong, W. M. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 52 ; 8377-8390

    Publication date:

    2017-01-01

    Size:

    14 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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