Charge-based deep level transient spectroscopy of B-doped and undoped polycrystalline diamond films: Fid-Bau Portal

Charge-based deep level transient spectroscopy of B-doped and undoped polycrystalline diamond films

Paprocki, K. / Fabisiak, K. / Bogdanowicz, R. / Gołuński, u. / Staryga, E. b. / Szybowicz, M. a. / Kowalska, M. / Banaszak-Piechowska, A.

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Charge-based deep level transient spectroscopy of B-doped and undoped polycrystalline diamond films

Paprocki, K. / Fabisiak, K. / Bogdanowicz, R. / Gołuński, u. / Staryga, E. b. / Szybowicz, M. a. / Kowalska, M. / Banaszak-Piechowska, A.

Charge-based deep level transient spectroscopy of B-doped and undoped polycrystalline diamond films

Paprocki, K. / Fabisiak, K. / Bogdanowicz, R. / Gołuński, u. / Staryga, E. b. / Szybowicz, M. a. / Kowalska, M. / Banaszak-Piechowska, A.

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Document information

Title:

Charge-based deep level transient spectroscopy of B-doped and undoped polycrystalline diamond films

Contributors:

Paprocki, K. (author) / Fabisiak, K. (author) / Bogdanowicz, R. (author) / Gołuński, u. (author) / Staryga, E. b. (author) / Szybowicz, M. a. (author) / Kowalska, M. (author) / Banaszak-Piechowska, A. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 52 ; 10119-10126

Publication date:

2017-01-01

Size:

8 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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