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    The influence of thermal processing on microstructure of sol–gel-derived SrSnO3 thin films

    New search for: Gul, E.
    New search for: Stanulis, A.
    New search for: Barushka, Y.
    New search for: Garskaite, E.
    New search for: Ramanauskas, R.
    New search for: Morkan, A. U.
    New search for: Kareiva, A.

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    The influence of thermal processing on microstructure of sol–gel-derived SrSnO3 thin films

    New search for: Gul, E.
    New search for: Stanulis, A.
    New search for: Barushka, Y.
    New search for: Garskaite, E.
    New search for: Ramanauskas, R.
    New search for: Morkan, A. U.
    New search for: Kareiva, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The influence of thermal processing on microstructure of sol–gel-derived SrSnO3 thin films

    New search for: Gul, E.
    New search for: Stanulis, A.
    New search for: Barushka, Y.
    New search for: Garskaite, E.
    New search for: Ramanauskas, R.
    New search for: Morkan, A. U.
    New search for: Kareiva, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    The influence of thermal processing on microstructure of sol–gel-derived SrSnO3 thin films

    Contributors:

    Gul, E. (author) / Stanulis, A. (author) / Barushka, Y. (author) / Garskaite, E. (author) / Ramanauskas, R. (author) / Morkan, A. U. (author) / Kareiva, A. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 52 ; 12624-12634

    Publication date:

    2017-01-01

    Size:

    11 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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