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    Characterization of hollow silica–polyelectrolyte composite nanoparticles by small-angle X-ray scattering

    New search for: Han, H.
    New search for: Li, L.
    New search for: Yang, Q.
    New search for: Tian, Y.
    New search for: Wang, Y.
    New search for: Ye, Z.
    New search for: von Klitzing, R.
    New search for: Guo, X.

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    Characterization of hollow silica–polyelectrolyte composite nanoparticles by small-angle X-ray scattering

    New search for: Han, H.
    New search for: Li, L.
    New search for: Yang, Q.
    New search for: Tian, Y.
    New search for: Wang, Y.
    New search for: Ye, Z.
    New search for: von Klitzing, R.
    New search for: Guo, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of hollow silica–polyelectrolyte composite nanoparticles by small-angle X-ray scattering

    New search for: Han, H.
    New search for: Li, L.
    New search for: Yang, Q.
    New search for: Tian, Y.
    New search for: Wang, Y.
    New search for: Ye, Z.
    New search for: von Klitzing, R.
    New search for: Guo, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Characterization of hollow silica–polyelectrolyte composite nanoparticles by small-angle X-ray scattering

    Contributors:

    Han, H. (author) / Li, L. (author) / Yang, Q. (author) / Tian, Y. (author) / Wang, Y. (author) / Ye, Z. (author) / von Klitzing, R. (author) / Guo, X. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 53 ; 3210-3224

    Publication date:

    2018-01-01

    Size:

    15 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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