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    Carbon ions irradiation induced modifications in structural and electrical resistivity characteristics of ZrN thin films

    New search for: Khan, Shakil
    New search for: Ahmed, Ishaq
    New search for: Khalid, Noaman
    New search for: Mehmood, Mazhar
    New search for: Waheed, Abdul
    New search for: Malik, Maaza

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    Carbon ions irradiation induced modifications in structural and electrical resistivity characteristics of ZrN thin films

    New search for: Khan, Shakil
    New search for: Ahmed, Ishaq
    New search for: Khalid, Noaman
    New search for: Mehmood, Mazhar
    New search for: Waheed, Abdul
    New search for: Malik, Maaza

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Carbon ions irradiation induced modifications in structural and electrical resistivity characteristics of ZrN thin films

    New search for: Khan, Shakil
    New search for: Ahmed, Ishaq
    New search for: Khalid, Noaman
    New search for: Mehmood, Mazhar
    New search for: Waheed, Abdul
    New search for: Malik, Maaza

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Carbon ions irradiation induced modifications in structural and electrical resistivity characteristics of ZrN thin films

    Contributors:

    Khan, Shakil (author) / Ahmed, Ishaq (author) / Khalid, Noaman (author) / Mehmood, Mazhar (author) / Waheed, Abdul (author) / Malik, Maaza (author)

    Published in:

    Materials science in semiconductor processing ; 39 ; 530-535

    Publication date:

    2015-01-01

    Size:

    6 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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