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    Corrigendum to “Sensitivity of nanoindentation strain rate in poly(ether-ether-ketone) using atomic force microscopy” [Polym. Test. 53 (2016) 85–88]

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    Corrigendum to “Sensitivity of nanoindentation strain rate in poly(ether-ether-ketone) using atomic force microscopy” [Polym. Test. 53 (2016) 85–88]

    New search for: Yang, Ying
    New search for: Niu, Yi-Fan

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    Corrigendum to “Sensitivity of nanoindentation strain rate in poly(ether-ether-ketone) using atomic force microscopy” [Polym. Test. 53 (2016) 85–88]

    New search for: Yang, Ying
    New search for: Niu, Yi-Fan

    Access

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    Document information
    Title:

    Corrigendum to “Sensitivity of nanoindentation strain rate in poly(ether-ether-ketone) using atomic force microscopy” [Polym. Test. 53 (2016) 85–88]

    Contributors:

    Yang, Ying (author) / Niu, Yi-Fan (author)

    Published in:

    Polymer testing ; 54 ; 308

    Publication date:

    2016-01-01

    Size:

    308 pages

    ISSN:

    0142-9418

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1920287

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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