Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates

    New search for: Huang, Qun
    New search for: Yang, Jie
    New search for: Huang, Wei
    New search for: Liu, Yin
    New search for: Hu, Heng
    New search for: Giunta, Gaetano
    New search for: Belouettar, Salim

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates

    New search for: Huang, Qun
    New search for: Yang, Jie
    New search for: Huang, Wei
    New search for: Liu, Yin
    New search for: Hu, Heng
    New search for: Giunta, Gaetano
    New search for: Belouettar, Salim

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates

    New search for: Huang, Qun
    New search for: Yang, Jie
    New search for: Huang, Wei
    New search for: Liu, Yin
    New search for: Hu, Heng
    New search for: Giunta, Gaetano
    New search for: Belouettar, Salim

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates

    Contributors:

    Huang, Qun (author) / Yang, Jie (author) / Huang, Wei (author) / Liu, Yin (author) / Hu, Heng (author) / Giunta, Gaetano (author) / Belouettar, Salim (author)

    Published in:

    Composite structures ; 160 ; 613-624

    Publication date:

    2017-01-01

    Size:

    12 pages

    ISSN:

    0263-8223

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  624.18

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates

    Huang, Qun / Yang, Jie / Huang, Wei et al. | British Library Online Contents | 2017

    A two-dimensional Fourier-series finite element for wrinkling analysis of thin films on compliant substrates

    Huang, Qun | Online Contents | 2017

    A two-dimensional Fourier-series finite element for wrinkling analysis of thin films on compliant substrates

    Huang, Qun / Xu, Rui / Liu, Yin et al. | Elsevier | 2016

    Concomitant wrinkling and buckle-delamination of elastic thin films on compliant substrates

    Mei, H. / Landis, C. M. / Huang, R. | British Library Online Contents | 2011

    Thermal wrinkling of thin membranes using a Fourier-related double scale approach

    Attipou, Kodjo | Online Contents | 2015

    Back to top