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    Quantum confinement and size effects in Cu2ZnSnS4 thin films produced using solution processed ultrafine nanoparticles

    New search for: Safdar, Amna
    New search for: Islam, Mohammad
    New search for: Ahmad, Iftikhar
    New search for: Akram, Aftab
    New search for: Mujahid, Mohammad
    New search for: Khalid, Yasir
    New search for: Zhu, Yanqiu

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    Quantum confinement and size effects in Cu2ZnSnS4 thin films produced using solution processed ultrafine nanoparticles

    New search for: Safdar, Amna
    New search for: Islam, Mohammad
    New search for: Ahmad, Iftikhar
    New search for: Akram, Aftab
    New search for: Mujahid, Mohammad
    New search for: Khalid, Yasir
    New search for: Zhu, Yanqiu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantum confinement and size effects in Cu2ZnSnS4 thin films produced using solution processed ultrafine nanoparticles

    New search for: Safdar, Amna
    New search for: Islam, Mohammad
    New search for: Ahmad, Iftikhar
    New search for: Akram, Aftab
    New search for: Mujahid, Mohammad
    New search for: Khalid, Yasir
    New search for: Zhu, Yanqiu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Quantum confinement and size effects in Cu2ZnSnS4 thin films produced using solution processed ultrafine nanoparticles

    Contributors:

    Safdar, Amna (author) / Islam, Mohammad (author) / Ahmad, Iftikhar (author) / Akram, Aftab (author) / Mujahid, Mohammad (author) / Khalid, Yasir (author) / Zhu, Yanqiu (author)

    Published in:

    Materials science in semiconductor processing ; 41 ; 420-427

    Publication date:

    2016-01-01

    Size:

    8 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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