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    FTIR-ATR spectroscopy in thin film studies: The importance of sampling depth and deposition substrate

    New search for: Laroche, G.
    New search for: Fitremann, J.
    New search for: Gherardi, N.

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    FTIR-ATR spectroscopy in thin film studies: The importance of sampling depth and deposition substrate

    New search for: Laroche, G.
    New search for: Fitremann, J.
    New search for: Gherardi, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    FTIR-ATR spectroscopy in thin film studies: The importance of sampling depth and deposition substrate

    New search for: Laroche, G.
    New search for: Fitremann, J.
    New search for: Gherardi, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    FTIR-ATR spectroscopy in thin film studies: The importance of sampling depth and deposition substrate

    Contributors:

    Laroche, G. (author) / Fitremann, J. (author) / Gherardi, N. (author)

    Published in:

    Applied surface science ; 273 ; 632-637

    Publication date:

    2013-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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