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    Effect of ZnSe/GaAs interface treatment in ZnSe quality control for optoelectronic device applications

    New search for: Park, Kwangwook
    New search for: Beaton, Daniel
    New search for: Steirer, Kenneth X.
    New search for: Alberi, Kirstin

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    Effect of ZnSe/GaAs interface treatment in ZnSe quality control for optoelectronic device applications

    New search for: Park, Kwangwook
    New search for: Beaton, Daniel
    New search for: Steirer, Kenneth X.
    New search for: Alberi, Kirstin

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effect of ZnSe/GaAs interface treatment in ZnSe quality control for optoelectronic device applications

    New search for: Park, Kwangwook
    New search for: Beaton, Daniel
    New search for: Steirer, Kenneth X.
    New search for: Alberi, Kirstin

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Effect of ZnSe/GaAs interface treatment in ZnSe quality control for optoelectronic device applications

    Contributors:

    Park, Kwangwook (author) / Beaton, Daniel (author) / Steirer, Kenneth X. (author) / Alberi, Kirstin (author)

    Published in:

    Applied surface science ; 405 ; 247-254

    Publication date:

    2017-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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