XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples: Fid-Bau Portal

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XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples

Maslakov, Konstantin I. / Teterin, Yury A. / Popel, Aleksej J. / Teterin, Anton Yu. / Ivanov, Kirill E. / Kalmykov, Stepan N. / Petrov, Vladimir G. / Petrov, Peter K. / Farnan, Ian

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XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples

Maslakov, Konstantin I. / Teterin, Yury A. / Popel, Aleksej J. / Teterin, Anton Yu. / Ivanov, Kirill E. / Kalmykov, Stepan N. / Petrov, Vladimir G. / Petrov, Peter K. / Farnan, Ian

XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples

Maslakov, Konstantin I. / Teterin, Yury A. / Popel, Aleksej J. / Teterin, Anton Yu. / Ivanov, Kirill E. / Kalmykov, Stepan N. / Petrov, Vladimir G. / Petrov, Peter K. / Farnan, Ian

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Title:

XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples

Contributors:

Maslakov, Konstantin I. (author) / Teterin, Yury A. (author) / Popel, Aleksej J. (author) / Teterin, Anton Yu. (author) / Ivanov, Kirill E. (author) / Kalmykov, Stepan N. (author) / Petrov, Vladimir G. (author) / Petrov, Peter K. (author) / Farnan, Ian (author)

Published in:

Applied surface science ; 448 ; 154-162

Publication date:

2018-01-01

Size:

9 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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