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Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation
Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation
Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation
Zhu, Y.K. (author) / Chen, Q.Y. (author) / Wang, Q. (author) / Yu, H.Y. (author) / Li, R. (author) / Hou, J.P. (author) / Zhang, Z.J. (author) / Zhang, G.P. (author) / Zhang, Z.F. (author)
Journal of materials science & technology ; 34 ; 1214-1221
2018-01-01
8 pages
Article (Journal)
English
DDC:
620.1105
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