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Ultrasonic detection of contour node represented voids and cracks
Ultrasonic detection of contour node represented voids and cracks
Ultrasonic detection of contour node represented voids and cracks
Yan, Bei (author) / Wu, Chongke (author) / Ma, Honglin (author)
Nondestructive testing and evaluation ; 33 ; 253-271
2018-01-01
19 pages
Article (Journal)
English
DDC:
620.112705
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