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    Atomistic study of the bending properties of silicon nanowires

    New search for: Zhuo, X.R.
    New search for: Beom, H.G.

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    Atomistic study of the bending properties of silicon nanowires

    New search for: Zhuo, X.R.
    New search for: Beom, H.G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atomistic study of the bending properties of silicon nanowires

    New search for: Zhuo, X.R.
    New search for: Beom, H.G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Atomistic study of the bending properties of silicon nanowires

    Contributors:

    Zhuo, X.R. (author) / Beom, H.G. (author)

    Published in:

    Computational materials science ; 152 ; 331-336

    Publication date:

    2018-01-01

    Size:

    6 pages

    ISSN:

    0927-0256

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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