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    Quantitative determining interface information of nano composite by synchrotron radiation small-angle X-ray scattering

    New search for: Xia, Xu
    New search for: Yin, Jinghua
    New search for: Su, Bo
    New search for: Hui, David
    New search for: Yu, Rentong
    New search for: Liu, Xiaoxu

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    Quantitative determining interface information of nano composite by synchrotron radiation small-angle X-ray scattering

    New search for: Xia, Xu
    New search for: Yin, Jinghua
    New search for: Su, Bo
    New search for: Hui, David
    New search for: Yu, Rentong
    New search for: Liu, Xiaoxu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative determining interface information of nano composite by synchrotron radiation small-angle X-ray scattering

    New search for: Xia, Xu
    New search for: Yin, Jinghua
    New search for: Su, Bo
    New search for: Hui, David
    New search for: Yu, Rentong
    New search for: Liu, Xiaoxu

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Quantitative determining interface information of nano composite by synchrotron radiation small-angle X-ray scattering

    Contributors:

    Xia, Xu (author) / Yin, Jinghua (author) / Su, Bo (author) / Hui, David (author) / Yu, Rentong (author) / Liu, Xiaoxu (author)

    Published in:

    Composites.Part B, Engineering ; 120 ; 92-96

    Publication date:

    2017-01-01

    Size:

    5 pages

    ISSN:

    1359-8368

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.118

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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