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A platform for research: civil engineering, architecture and urbanism
In situ observation of low temperature growth of Ge on Si(111) by reflection high energy electron diffraction
In situ observation of low temperature growth of Ge on Si(111) by reflection high energy electron diffraction
In situ observation of low temperature growth of Ge on Si(111) by reflection high energy electron diffraction
Grimm, Andreas (author) / Fissel, Andreas (author) / Bugiel, Eberhard (author) / Wietler, Tobias F. (author)
Applied surface science ; 370 ; 40-48
2016-01-01
9 pages
Article (Journal)
English
DDC:
620.44
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| British Library Online Contents | 2016
| British Library Online Contents | 2016
Reflection High Energy Electron Diffraction
| Springer Verlag | 1992
Reflection High-Energy Electron Diffraction (RHEED)
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Inelastic electron analysis in reflection high-energy electron diffraction condition
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