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    Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

    New search for: Aboulfadl, Hisham
    New search for: Seifried, Fabian
    New search for: Stüber, Michael
    New search for: Mücklich, Frank

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    Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

    New search for: Aboulfadl, Hisham
    New search for: Seifried, Fabian
    New search for: Stüber, Michael
    New search for: Mücklich, Frank

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

    New search for: Aboulfadl, Hisham
    New search for: Seifried, Fabian
    New search for: Stüber, Michael
    New search for: Mücklich, Frank

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

    Contributors:

    Aboulfadl, Hisham (author) / Seifried, Fabian (author) / Stüber, Michael (author) / Mücklich, Frank (author)

    Published in:

    MATERIALS LETTERS ; 236 ; 92-95

    Publication date:

    2019-01-01

    Size:

    4 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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