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Three-dimensional atomic force microscopy for ultra-high-aspect-ratio imaging
Three-dimensional atomic force microscopy for ultra-high-aspect-ratio imaging
Three-dimensional atomic force microscopy for ultra-high-aspect-ratio imaging
Akhtar, Imtisal (author) / Rehman, Malik Abdul (author) / Choi, Woosuk (author) / Kumar, Sunil (author) / Lee, Neasung (author) / Cho, Sang-Joon (author) / Park, Hyeong-Ho (author) / Park, Kyung-Ho (author) / Seo, Yongho (author)
Applied surface science ; 469 ; 582-592
2019-01-01
11 pages
Article (Journal)
English
DDC:
620.44
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