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Evaluation of obliquely evaporated gadolinium gratings for neutron interferometry by X-ray microtomography
Evaluation of obliquely evaporated gadolinium gratings for neutron interferometry by X-ray microtomography
Evaluation of obliquely evaporated gadolinium gratings for neutron interferometry by X-ray microtomography
Samoto, Tetsuo (author) / Takano, Hidekazu (author) / Momose, Atsushi (author)
Materials science in semiconductor processing ; 92 ; 91-95
2019-01-01
5 pages
Article (Journal)
English
DDC:
621.38152
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