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    A physical-based yield strength model for the microstructural degradation of G115 steel during long-term creep

    New search for: Xiao, Bo
    New search for: Xu, Lianyong
    New search for: Tang, Zhengxin
    New search for: Zhao, Lei
    New search for: Jing, Hongyang
    New search for: Han, Yongdian
    New search for: Li, Haizhou

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    A physical-based yield strength model for the microstructural degradation of G115 steel during long-term creep

    New search for: Xiao, Bo
    New search for: Xu, Lianyong
    New search for: Tang, Zhengxin
    New search for: Zhao, Lei
    New search for: Jing, Hongyang
    New search for: Han, Yongdian
    New search for: Li, Haizhou

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A physical-based yield strength model for the microstructural degradation of G115 steel during long-term creep

    New search for: Xiao, Bo
    New search for: Xu, Lianyong
    New search for: Tang, Zhengxin
    New search for: Zhao, Lei
    New search for: Jing, Hongyang
    New search for: Han, Yongdian
    New search for: Li, Haizhou

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    A physical-based yield strength model for the microstructural degradation of G115 steel during long-term creep

    Contributors:

    Xiao, Bo (author) / Xu, Lianyong (author) / Tang, Zhengxin (author) / Zhao, Lei (author) / Jing, Hongyang (author) / Han, Yongdian (author) / Li, Haizhou (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 747 ; 161-176

    Publication date:

    2019-01-01

    Size:

    16 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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