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    Toughening mechanism of SIALON/Si2N2O multiphase ceramics and finite element simulation of stress field at crack tip

    New search for: Luo, Junting
    New search for: Xi, Chenyang
    New search for: Gu, Yongfei
    New search for: Zhang, Lili
    New search for: Zhang, Chunxiang
    New search for: Xue, Yahong
    New search for: Zhang, Zhen

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    Toughening mechanism of SIALON/Si2N2O multiphase ceramics and finite element simulation of stress field at crack tip

    New search for: Luo, Junting
    New search for: Xi, Chenyang
    New search for: Gu, Yongfei
    New search for: Zhang, Lili
    New search for: Zhang, Chunxiang
    New search for: Xue, Yahong
    New search for: Zhang, Zhen

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Toughening mechanism of SIALON/Si2N2O multiphase ceramics and finite element simulation of stress field at crack tip

    New search for: Luo, Junting
    New search for: Xi, Chenyang
    New search for: Gu, Yongfei
    New search for: Zhang, Lili
    New search for: Zhang, Chunxiang
    New search for: Xue, Yahong
    New search for: Zhang, Zhen

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Toughening mechanism of SIALON/Si2N2O multiphase ceramics and finite element simulation of stress field at crack tip

    Contributors:

    Luo, Junting (author) / Xi, Chenyang (author) / Gu, Yongfei (author) / Zhang, Lili (author) / Zhang, Chunxiang (author) / Xue, Yahong (author) / Zhang, Zhen (author)

    Published in:

    Computational materials science ; 159 ; 194-201

    Publication date:

    2019-01-01

    Size:

    8 pages

    ISSN:

    0927-0256

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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