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    Defect sensitivity and Weibull strength analysis of monolayer silicene

    New search for: Roman, Ruth E.
    New search for: Cranford, Steven W.

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    Defect sensitivity and Weibull strength analysis of monolayer silicene

    New search for: Roman, Ruth E.
    New search for: Cranford, Steven W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defect sensitivity and Weibull strength analysis of monolayer silicene

    New search for: Roman, Ruth E.
    New search for: Cranford, Steven W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Defect sensitivity and Weibull strength analysis of monolayer silicene

    Contributors:

    Roman, Ruth E. (author) / Cranford, Steven W. (author)

    Published in:

    Mechanics of materials ; 133 ; 13-25

    Publication date:

    2019-01-01

    Size:

    13 pages

    ISSN:

    0167-6636

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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