A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Electron microscopy in materials science : proceedings of the International School on Electron Microscopy in Materials Science, Mesagne, Brindisi, Italy, 7-19 October 1991
PART I: TRANSMISSION ELECTRON MICROSCOPY: Introduction in Electron Optics -- Kinematical and Dynamical Diffraction Theory -- Wave Optical Theory of Imaging in Electron Lenses -- High Resolution Electron Microscopy -- Electron Holography -- Electron Crystallography -- Materials Microstructure: Analysis with High Resolution Analytical Electron Microscopy -- High-Resolution Imaging in the Scanning Transmission Electron Microscope -- Energy Loss Spectroscopy for Transmission Electron Microscopy -- X-Ray Microanalysis in the Analytical Electron Microscope -- PART II: SCANNING ELECTRON MICROSCOPY: Scanning Electron Microscopy the Instrument: Electron Optics and Detectors -- Secondary and Backscattered Electron Emission in the Scanning Electron Microscope – High Resolution Imaging -- Notes on the ZAF Algorithm -- Voltage Contrast -- Cathodoluminescence in Scanning Electron Microscopy -- Monte Carlo Simulation of Electron Transport -- An Introduction to Practical Quantitative EBIC -- Scanning Tunneling Microscopy -- Atomic Force Microscopy.
Electron microscopy in materials science : proceedings of the International School on Electron Microscopy in Materials Science, Mesagne, Brindisi, Italy, 7-19 October 1991
PART I: TRANSMISSION ELECTRON MICROSCOPY: Introduction in Electron Optics -- Kinematical and Dynamical Diffraction Theory -- Wave Optical Theory of Imaging in Electron Lenses -- High Resolution Electron Microscopy -- Electron Holography -- Electron Crystallography -- Materials Microstructure: Analysis with High Resolution Analytical Electron Microscopy -- High-Resolution Imaging in the Scanning Transmission Electron Microscope -- Energy Loss Spectroscopy for Transmission Electron Microscopy -- X-Ray Microanalysis in the Analytical Electron Microscope -- PART II: SCANNING ELECTRON MICROSCOPY: Scanning Electron Microscopy the Instrument: Electron Optics and Detectors -- Secondary and Backscattered Electron Emission in the Scanning Electron Microscope – High Resolution Imaging -- Notes on the ZAF Algorithm -- Voltage Contrast -- Cathodoluminescence in Scanning Electron Microscopy -- Monte Carlo Simulation of Electron Transport -- An Introduction to Practical Quantitative EBIC -- Scanning Tunneling Microscopy -- Atomic Force Microscopy.
Electron microscopy in materials science : proceedings of the International School on Electron Microscopy in Materials Science, Mesagne, Brindisi, Italy, 7-19 October 1991
International School on Electron Microscopy
1992
1 Online-Ressource (698 p)
ill
Campusweiter Zugriff (Universität Hannover) - Vervielfältigungen (z.B. Kopien, Downloads) sind nur von einzelnen Kapiteln oder Seiten und nur zum eigenen wissenschaftlichen Gebrauch erlaubt. Keine Weitergabe an Dritte. Kein systematisches Downloaden durch Robots.
Includes bibliographical references
Conference Proceedings
Electronic Resource
English
DDC:
620.11299
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