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Advanced characterization of nanostructured materials : probing the structure and dynamics with synchrotron x-rays and neutrons
Neutron scattering techniques for the study of ordering in organic films / Jeffrey Penfold -- Grazing incidence X-ray scattering techniques to study growth mechanism of organic films / Rupak Banerjee, Stefan Kowarik, and Frank Schreiber -- Langmuir monolayer induced ordering / Alokmay Datta -- Nanoparticles at liquid interfaces / Mrinal K Bera and Milan K Sanyal -- Characterization of nanostructured materials by synchrotron high-energy X-ray scattering / Yang Ren, Yugang Sun, Zonghai Chen, and Valeri Petkov -- Synchrotron X-ray characterization of atomic and nanoscale structures in aperiodic materials from ambient to extreme conditions : synergic collaboration with large-scale computer simulations / Shinji Kohara and Jaakko Akola -- X-ray photon correlation spectroscopy to study dynamics of thin polymer films / Mrinmay K Mukhopadhyay, and Jaydeep K Basu -- X-ray Absorption Fine Structure Techniques for Nano-Catalytic Materials / Nobuyuki Ichikuni, Kazu Okumura, and Yasuhiro Iwasawa.
"Advanced Characterization of Nanostructured Materials - Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community"--Publisher's website
Advanced characterization of nanostructured materials : probing the structure and dynamics with synchrotron x-rays and neutrons
Neutron scattering techniques for the study of ordering in organic films / Jeffrey Penfold -- Grazing incidence X-ray scattering techniques to study growth mechanism of organic films / Rupak Banerjee, Stefan Kowarik, and Frank Schreiber -- Langmuir monolayer induced ordering / Alokmay Datta -- Nanoparticles at liquid interfaces / Mrinal K Bera and Milan K Sanyal -- Characterization of nanostructured materials by synchrotron high-energy X-ray scattering / Yang Ren, Yugang Sun, Zonghai Chen, and Valeri Petkov -- Synchrotron X-ray characterization of atomic and nanoscale structures in aperiodic materials from ambient to extreme conditions : synergic collaboration with large-scale computer simulations / Shinji Kohara and Jaakko Akola -- X-ray photon correlation spectroscopy to study dynamics of thin polymer films / Mrinmay K Mukhopadhyay, and Jaydeep K Basu -- X-ray Absorption Fine Structure Techniques for Nano-Catalytic Materials / Nobuyuki Ichikuni, Kazu Okumura, and Yasuhiro Iwasawa.
"Advanced Characterization of Nanostructured Materials - Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community"--Publisher's website
Advanced characterization of nanostructured materials : probing the structure and dynamics with synchrotron x-rays and neutrons
Sinha, Sunil K. (editor) / Sanyal, Milan K. (editor) / Loong, Chun Keung (editor)
2021
1 Online-Ressource (xiv, 415 pages)
Campusweiter Zugriff (Universität Hannover) - Vervielfältigungen (z.B. Kopien, Downloads) sind nur von einzelnen Kapiteln oder Seiten und nur zum eigenen wissenschaftlichen Gebrauch erlaubt. Keine Weitergabe an Dritte. Kein systematisches Downloaden durch Robots.
Book
Electronic Resource
English
DDC:
620.115
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