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    Projektion von Laser-Speckles zur 3D-Vermessung von Oberflächen

    New search for: Stark, A.
    New search for: Wong, E.
    New search for: Babovsky, H.
    New search for: Kowarschik, R.

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    Projektion von Laser-Speckles zur 3D-Vermessung von Oberflächen

    New search for: Stark, A.
    New search for: Wong, E.
    New search for: Babovsky, H.
    New search for: Kowarschik, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Projektion von Laser-Speckles zur 3D-Vermessung von Oberflächen

    New search for: Stark, A.
    New search for: Wong, E.
    New search for: Babovsky, H.
    New search for: Kowarschik, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Projektion von Laser-Speckles zur 3D-Vermessung von Oberflächen

    Contributors:

    Stark, A. (author) / Wong, E. (author) / Babovsky, H. (author) / Kowarschik, R. (author)

    Conference:

    Oldenburger 3D-Tage ; 19. ; 2020 ; Oldenburg (Oldenburg)

    Published in:

    Photogrammetrie - Laserscanning - Optische 3D-Messtechnik

    Publication date:

    2020

    ISBN:

    9783879076888 , 387907688X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    German

    Keywords:

    Laserscanner , Fotogrammetrie , Optische Messtechnik

    Classification:

    RVK:  ZI 9510 / ZI 9035 / ZQ 3900
    BKL:  74.41 Luftaufnahmen, Photogrammetrie / 50.21 Messtechnik

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