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    Using Atomic Force Microscopy to Evaluate Microstructure for Direct Metal Laser Melted Titanium

    New search for: Wong, G.
    New search for: Sharp, C.

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    Using Atomic Force Microscopy to Evaluate Microstructure for Direct Metal Laser Melted Titanium

    New search for: Wong, G.
    New search for: Sharp, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Using Atomic Force Microscopy to Evaluate Microstructure for Direct Metal Laser Melted Titanium

    New search for: Wong, G.
    New search for: Sharp, C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Using Atomic Force Microscopy to Evaluate Microstructure for Direct Metal Laser Melted Titanium

    Contributors:

    Wong, G. (author) / Sharp, C. (author)

    Conference:

    International Conference on Material Engineering and Manufacturing ; 5. ; 2021 ; Online

    Published in:

    Material engineering and manufacturing IV

    Publication date:

    2021

    ISBN:

    9783035718591

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    Materials science , Manufacturing processes , Nanostructured materials

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