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Technology, measurement & analysis : proceedings of the Second International Airborne Remote Sensing Conference and Exhibition, 24 - 27 June 1996, San Francisco, California, USA ; Vol. 2

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Technology, measurement & analysis : proceedings of the Second International Airborne Remote Sensing Conference and Exhibition, 24 - 27 June 1996, San Francisco, California, USA ; Vol. 2

Table of contents

Technology, measurement & analysis : proceedings of the Second International Airborne Remote Sensing Conference and Exhibition, 24 - 27 June 1996, San Francisco, California, USA ; Vol. 2

Table of contents

Access

Access via TIB

Check availability in my library

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Technology, measurement & analysis : proceedings of the Second International Airborne Remote Sensing Conference and Exhibition, 24 - 27 June 1996, San Francisco, California, USA ; Vol. 2

Conference:

International Airborne Remote Sensing Conference and Exhibition ; 2 ; 1996 ; San Francisco, Calif.

Publication date:

1996

Size:

XXIX, 745 S

Remarks:

Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek

Type of media:

Conference Proceedings

Type of material:

Language:

English

Keywords:

Fernerkundung

Classification:

BKL: 53.84 Ortungstechnik, Radartechnik / 38.03 Methoden und Techniken der Geowissenschaften / 74.41 Luftaufnahmen, Photogrammetrie