1 Introduction -- 1.1 The Origin of Stresses -- 1.2 Methods of Measuring Residual Stresses -- 1.3 Some Examples of Residual Stresses -- References -- 2 Fundamental Concepts in Stress Analysis -- 2.1 Introduction -- 2.2 Definitions -- 2.3 Stress and Strain -- 2.4 Forces and Stresses -- 2.5 Displacements and Strains -- 2.6 Transformation of Axes and Tensor Notation -- 2.7 Elastic Stress-Strain Relations for Isotropic Materials -- 2.8 Structure of Single Crystals -- 2.9 Elastic Stress-Strain Relations in Single Crystals -- 2.10 Equations of Equilibrium -- 2.11 Conditions of Compatibility -- 2.12 Basic Definitions in Plastic Deformation -- 2.13 Plastic Deformation of Single Crystals -- 2.14 Deformation and Yielding in Inhomogeneous Materials -- Problems -- 3 Analysis of Residual Stress Fields Using Linear Elasticity Theory -- 3.1 Introduction -- 3.2 Macroresidual Stresses -- 3.3 Equations of Equilibrium for Macrostresses -- 3.4 Microstresses -- 3.5 Equations of Equilibrium for Micro- and Pseudo-Macrostresses -- 3.6 Calculation of Micro- and PM Stresses -- 3.7 The Total Stress State in Surface Deformed Multiphase Materials -- 3.8 Macroscopic Averages of Single Crystal Elastic Constants -- 3.9 The Voigt Average -- 3.10 The Reuss Average -- 3.11 Other Approaches to Elastic Constant Determination -- 3.12 Average Diffraction Elastic Constants -- Summary -- References -- 4 Fundamental Concepts in X-ray Diffraction -- 4.1 Introduction -- 4.2 Fundamentals of X-rays -- 4.3 Short-wavelength Limit and the Continuous Spectrum -- 4.4 Characteristic Radiation Lines -- 4.5 X-ray Sources -- 4.6 Absorption of X-rays -- 4.7 Filtering of X-rays -- 4.8 Scattering of X-rays -- 4.9 Scattering from Planes of Atoms -- 4.10 The Structure Factor of a Unit Cell -- 4.11 Experimental Utilization of Bragg’s Law -- 4.12 Monochromators -- 4.13 Collimators and Slits -- 4.14 Diffraction Patterns from Single Crystals -- 4.15 Diffraction Patterns from Polycrystalline Specimens -- 4.16 Basic Diffractometer Geometry -- 4.17 Intensity of Diffracted Lines for Polycrystals -- 4.18 Multiplicity -- 4.19 Lorentz Factor -- 4.20 Absorption Factor -- 4.21 Temperature Factor -- 4.22 X-ray Detectors -- 4.23 Deadtime Correction for Detection Systems -- 4.24 Total Diffracted Intensity at a Given Angle 20 -- 4.25 Depth of Penetration of X-rays -- 4.26 Fundamental Concepts in Neutron Diffraction -- 4.27 Scattering and Absorption of Neutrons -- Problems -- Bibliography and References -- 5 Determination of Strain and Stress Fields by Diffraction Methods -- 5.1 Introduction -- 5.2 Fundamental Equations of X-ray Strain Determination -- 5.3 Analysis of Regular “d” vs. sin2? Data -- 5.4 Determination of Stresses from Diffraction Data -- 5.5 Biaxial Stress Analysis -- 5.6 Triaxial Stress Analysis -- 5.7 Determination of the Unstressed Lattice Spacing -- 5.8 Effect of Homogeneity of the Strain Distribution and Specimen Anisotropy -- 5.9 Average Strain Data from Single Crystal Specimens -- 5.10 Interpretation of the Average X-ray Strain Data Measured from Polycrystalline Specimens -- 5.11 Interpretation of Average Stress States in Polycrystalline Specimens -- 5.12 Effect of Stress Gradients Normal to the Surface on d vs. sin2? Data -- 5.13 Experimental Determination of X-ray Elastic Constants -- 5.14 Determination of Stresses from Oscillatory Data -- 5.15 Stress Measurements with Neutron Diffraction -- 5.16 Effect of Composition Gradients with Depth -- 5.17 X-ray Determination of Yielding -- 5.18 Summary -- Problem -- References -- 6 Experimental Errors Associated with the X-ray Measurement of Residual Stress -- 6.1 Introduction -- 6.2 Selection of the Diffraction Peak for Stress Measurements -- 6.3 Peak Location -- 6.4 Determination of Peak Position for Asymmetric Peaks -- 6.5 Statistical Errors Associated with the X-ray Measurement of Line Profiles -- 6.6 Statistical Errors in Stress -- 6.7 Instrumental Errors in Residual Stress Analysis -- 6.8 Corrections for Macrostress Gradients -- 6.9 Corrections for Layer Removal -- 6.10 Summary -- Problems -- References -- 7 The Practical Use of X-ray Techniques -- 7.1 Introduction -- 7.2 The Use of Ordinary Diffractometers -- 7.3 Software and Hardware Requirements -- 7.4 Available Instruments -- 7.5 Selected Applications of a Portable X-ray Residual Stress Unit (By W. P. Evans) -- Reference -- 8 The Shape of Diffraction Peaks — X-ray Line Broadening -- 8.1 Introduction -- 8.2 Slit Corrections -- 8.3 Fourier Analysis of Peak Broadening -- Problem -- References -- Appendix A: Solutions to Problems -- Appendix B -- B.1 Introduction -- B.2 The Marion-Cohen Method -- B.3 Dölle-Hauk Method (Oscillation-free Reflections) -- B.4 Methods of Peiter and Lode -- B.5 Use of High Multiplicity Peaks -- References -- Appendix C: Fourier Analysis -- Appendix D: Location of Useful Information in “International Tables for Crystallography” -- Appendix F: A Compilation of X-ray Elastic Constants (By Dr. M. James) -- References.