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Use of Digital Imaging Technique for Studying Strain Localizations
Non-uniformities developed in a soil specimen during triaxial testing due to strain localization at the initiation stage are often difficult to be detected. In this study, the initiation and inclination of shear bands are studied by developing a method that can quantify the variation of local strain on a deforming specimen with reasonable degree of accuracy. Recent developments in digital image analysis (DIA) facilitate for capturing and studying local deformations within the specimen as a function of global deformations. This research offers a new method for producing the strain contour plots and studying the initiation and propagation of strain localization for clay specimens subjected to shear deformation and has implications to constitutive modeling of cohesive materials.
Use of Digital Imaging Technique for Studying Strain Localizations
Non-uniformities developed in a soil specimen during triaxial testing due to strain localization at the initiation stage are often difficult to be detected. In this study, the initiation and inclination of shear bands are studied by developing a method that can quantify the variation of local strain on a deforming specimen with reasonable degree of accuracy. Recent developments in digital image analysis (DIA) facilitate for capturing and studying local deformations within the specimen as a function of global deformations. This research offers a new method for producing the strain contour plots and studying the initiation and propagation of strain localization for clay specimens subjected to shear deformation and has implications to constitutive modeling of cohesive materials.
Use of Digital Imaging Technique for Studying Strain Localizations
Sachan, Ajanta (author) / Lin, Han (author) / Penumadu, Dayakar (author)
GeoCongress 2006 ; 2006 ; Atlanta, Georgia, United States
GeoCongress 2006 ; 1-6
2006-02-21
Conference paper
Electronic Resource
English
Use of Digital Imaging Technique for Studying Strain Localizations
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