A platform for research: civil engineering, architecture and urbanism
Method in which beam of white light of X-rays is sent through crystal at angle of inclination with row under examination. Reticular planes through row give reflected rays characteristically distributed.
Method in which beam of white light of X-rays is sent through crystal at angle of inclination with row under examination. Reticular planes through row give reflected rays characteristically distributed.
Orientation of layers and reticular planes of crystals
Determination de l'orientation des rangees et des plans reticulaires d'un cristal
Canac, F. (author)
1920
4 pages
1 Fig.
Article (Journal)
French
© Metadata Copyright Elsevier B. V. All rights reserved.