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Electron-beam-oscillograph semiquantitative phase analysis
Using method, in which primary electron beam is displaced while exposed samples remain stationary, two free structural components of alloy under investigation can be exposed on same plate; method is effective for study of oxidation processes and chemicothermal treatment of metallic films. (see also English translation in Indus Laboratory v 25 n 6 June 1959 p 721-7)
Electron-beam-oscillograph semiquantitative phase analysis
Using method, in which primary electron beam is displaced while exposed samples remain stationary, two free structural components of alloy under investigation can be exposed on same plate; method is effective for study of oxidation processes and chemicothermal treatment of metallic films. (see also English translation in Indus Laboratory v 25 n 6 June 1959 p 721-7)
Electron-beam-oscillograph semiquantitative phase analysis
Elektronograficheskii polukolichestvennyi fazovyi analiz
Palatnik, L.S. (author) / Boiko, B.T. (author)
1959
7 pages
Article (Journal)
Russian
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