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Monte Carlo simulation of electron-solid interactions in cement-based materials
AbstractKnowledge of the size of the electron-solid interaction volume and the sampling volume of various signals within it is important for interpretation of images and analytical results obtained from electron microscopy. In this study we used a Monte Carlo technique to simulate electron trajectories in order to investigate the shape and size of the interaction volume, the spatial and energy distribution of backscattered electrons and characteristic X-rays in cement-based materials. We found that the maximum penetration depth of the electron trajectories ranges from 0.75 to 1.5μm at 10keV and from 2.5 to 5.0μm at 20keV. For backscattered electrons, the maximum sampling depth is about 30% of the interaction volume depth and its lateral dimension is close to the interaction volume depth. The sampling volume size of characteristic X-rays is a substantial fraction of the interaction volume. For ettringite, the amount of material analysed in X-ray microanalysis is in the order of 1 to 100μm3 at conventional SEM accelerating voltages of 10 to 20keV.
Monte Carlo simulation of electron-solid interactions in cement-based materials
AbstractKnowledge of the size of the electron-solid interaction volume and the sampling volume of various signals within it is important for interpretation of images and analytical results obtained from electron microscopy. In this study we used a Monte Carlo technique to simulate electron trajectories in order to investigate the shape and size of the interaction volume, the spatial and energy distribution of backscattered electrons and characteristic X-rays in cement-based materials. We found that the maximum penetration depth of the electron trajectories ranges from 0.75 to 1.5μm at 10keV and from 2.5 to 5.0μm at 20keV. For backscattered electrons, the maximum sampling depth is about 30% of the interaction volume depth and its lateral dimension is close to the interaction volume depth. The sampling volume size of characteristic X-rays is a substantial fraction of the interaction volume. For ettringite, the amount of material analysed in X-ray microanalysis is in the order of 1 to 100μm3 at conventional SEM accelerating voltages of 10 to 20keV.
Monte Carlo simulation of electron-solid interactions in cement-based materials
Wong, H.S. (author) / Buenfeld, N.R. (author)
Cement and Concrete Research ; 36 ; 1076-1082
2006-03-10
7 pages
Article (Journal)
Electronic Resource
English
Monte Carlo simulation of electron-solid interactions in cement-based materials
| Online Contents | 2006
Monte Carlo simulation of electron-solid interactions in cement-based materials
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Monte Carlo simulation of electron-solid interactions in cement-based materials
| British Library Online Contents | 2006
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