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A platform for research: civil engineering, architecture and urbanism
Plate-type track paving layer roughness measuring device and roughness measuring method
The invention discloses a plate-type track paving layer roughness measuring device and a roughness measuring method, the device comprises a frame and a measuring assembly, a first moving assembly anda second moving assembly are arranged between the measuring assembly and the frame, and the measuring assembly moves in the frame along the X axis through the first moving assembly. The measuring assembly moves in the frame along the Y axis through the second moving assembly; the measuring assembly comprises a probe capable of moving in the vertical direction and a depth gauge capable of displaying the movement amount of the probe; the measuring method is realized through the device. When the device is used, the device can be conveniently adjusted to be completely parallel to a to-be-measuredsurface, continuous measurement of all positions of the to-be-measured surface can be achieved, measurement data are displayed on external electronic equipment in real time, coordinates and roughnesscan be manually or automatically recorded, measurement efficiency is improved, and the obtained data can completely reflect the roughness distribution of the surface to be measured, so that the measurement error and the labor cost are greatly reduced.
本发明公开了一种板式轨道摊铺层粗糙度测量装置以及粗糙度测量方法，装置包括框架和测量组件，测量组件与框架之间设置有第一移动组件和第二移动组件，测量组件通过第一移动组件在框架内沿X轴移动，测量组件通过第二移动组件在框架内沿Y轴移动；测量组件包括可沿垂直方向移动的探针和可显示探针移动量的深度表；测量方法通过上述装置实现。本发明在使用时可便捷地将自身调节至与待测表面完全平行的状态，还可实现对待测表面所有位置的连续测量，测量数据实时显示在外界的电子设备上，可选择人工或自动对坐标和粗糙度进行记录，提高了测量效率，得到的数据可完整反映待测表面的粗糙度分布，大大降低了测量误差和人工成本。
Plate-type track paving layer roughness measuring device and roughness measuring method
The invention discloses a plate-type track paving layer roughness measuring device and a roughness measuring method, the device comprises a frame and a measuring assembly, a first moving assembly anda second moving assembly are arranged between the measuring assembly and the frame, and the measuring assembly moves in the frame along the X axis through the first moving assembly. The measuring assembly moves in the frame along the Y axis through the second moving assembly; the measuring assembly comprises a probe capable of moving in the vertical direction and a depth gauge capable of displaying the movement amount of the probe; the measuring method is realized through the device. When the device is used, the device can be conveniently adjusted to be completely parallel to a to-be-measuredsurface, continuous measurement of all positions of the to-be-measured surface can be achieved, measurement data are displayed on external electronic equipment in real time, coordinates and roughnesscan be manually or automatically recorded, measurement efficiency is improved, and the obtained data can completely reflect the roughness distribution of the surface to be measured, so that the measurement error and the labor cost are greatly reduced.
本发明公开了一种板式轨道摊铺层粗糙度测量装置以及粗糙度测量方法，装置包括框架和测量组件，测量组件与框架之间设置有第一移动组件和第二移动组件，测量组件通过第一移动组件在框架内沿X轴移动，测量组件通过第二移动组件在框架内沿Y轴移动；测量组件包括可沿垂直方向移动的探针和可显示探针移动量的深度表；测量方法通过上述装置实现。本发明在使用时可便捷地将自身调节至与待测表面完全平行的状态，还可实现对待测表面所有位置的连续测量，测量数据实时显示在外界的电子设备上，可选择人工或自动对坐标和粗糙度进行记录，提高了测量效率，得到的数据可完整反映待测表面的粗糙度分布，大大降低了测量误差和人工成本。
Plate-type track paving layer roughness measuring device and roughness measuring method
一种板式轨道摊铺层粗糙度测量装置及粗糙度测量方法
CHEN XIANMAI (author) / XU LEI (author) / PENG JUN (author) / DONG CHUNMIN (author) / LI SAI (author) / PAN LIU (author) / CHEN NAN (author) / WANG RIJI (author)
2021-02-09
Patent
Electronic Resource
Chinese
IPC:
E01B
PERMANENT WAY
,
Gleisoberbau
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