A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
SCANNING METHOD OF GROUND SAMPLE, METHOD OF PRODUCING TEST SAMPLE OF GROUND SAMPLE, SOIL TEST METHOD OF GROUND SAMPLE AND SCANNING APPARATUS OF GROUND SAMPLE
PROBLEM TO BE SOLVED: To provide a scanning method of ground samples, a method of producing test samples of ground samples, a soil test method of ground samples and a scanning apparatus of ground samples, capable of preventing inadvertent disturbance and the like due to the handling of the ground sample by scanning the ground sample at an original position and X-ray imaging of long ground samples.SOLUTION: Included are a sampler penetration step 5 for penetrating a sampler into the ground, and a scan process 7 for acquiring scan data of a long ground sample from the X-ray photograph of the ground sample formed by penetrating the sampler in the ground or in the vicinity of the ground, which is taken by an imaging device provided either in the sampler or above the sampler.SELECTED DRAWING: Figure 1
【課題】原位置での地盤試料のスキャンを行うことで地盤試料の取扱いによる不用意な攪乱等を防止できるとともに、長尺の地盤試料のＸ線撮影が可能な地盤試料のスキャン方法、地盤試料の供試体の生産方法、地盤試料の土質試験方法及び地盤試料のスキャン装置を提供する。【解決手段】地盤にサンプラーを貫入するサンプラー貫入工程５と、サンプラーの貫入によって形成した地盤試料を、前記サンプラー又は前記サンプラーの上方のいずれかに設けられた撮影装置を用いて土中又は地表付近でＸ線撮影し、長尺の地盤試料のスキャンデータを取得するスキャン工程７とで構成される。【選択図】図１
SCANNING METHOD OF GROUND SAMPLE, METHOD OF PRODUCING TEST SAMPLE OF GROUND SAMPLE, SOIL TEST METHOD OF GROUND SAMPLE AND SCANNING APPARATUS OF GROUND SAMPLE
PROBLEM TO BE SOLVED: To provide a scanning method of ground samples, a method of producing test samples of ground samples, a soil test method of ground samples and a scanning apparatus of ground samples, capable of preventing inadvertent disturbance and the like due to the handling of the ground sample by scanning the ground sample at an original position and X-ray imaging of long ground samples.SOLUTION: Included are a sampler penetration step 5 for penetrating a sampler into the ground, and a scan process 7 for acquiring scan data of a long ground sample from the X-ray photograph of the ground sample formed by penetrating the sampler in the ground or in the vicinity of the ground, which is taken by an imaging device provided either in the sampler or above the sampler.SELECTED DRAWING: Figure 1
【課題】原位置での地盤試料のスキャンを行うことで地盤試料の取扱いによる不用意な攪乱等を防止できるとともに、長尺の地盤試料のＸ線撮影が可能な地盤試料のスキャン方法、地盤試料の供試体の生産方法、地盤試料の土質試験方法及び地盤試料のスキャン装置を提供する。【解決手段】地盤にサンプラーを貫入するサンプラー貫入工程５と、サンプラーの貫入によって形成した地盤試料を、前記サンプラー又は前記サンプラーの上方のいずれかに設けられた撮影装置を用いて土中又は地表付近でＸ線撮影し、長尺の地盤試料のスキャンデータを取得するスキャン工程７とで構成される。【選択図】図１
SCANNING METHOD OF GROUND SAMPLE, METHOD OF PRODUCING TEST SAMPLE OF GROUND SAMPLE, SOIL TEST METHOD OF GROUND SAMPLE AND SCANNING APPARATUS OF GROUND SAMPLE
地盤試料のスキャン方法、地盤試料の供試体の生産方法、地盤試料の土質試験方法及び地盤試料のスキャン装置
MATSUMURA SATOSHI (author) / MIZUTANI SURYO (author) / KOHAMA EIJI (author) / KONDO AKIHIKO (author) / SAKAI KAZUO (author) / WANG BO (author) / SAITO NORIO (author) / SUZUKI SHUICHI (author) / LIU XIAOJUN (author)
2018-11-29
Patent
Electronic Resource
Japanese
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