A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
STRUCTURE INSPECTION SUPPORT APPARATUS, STRUCTURE INSPECTION SUPPORT SYSTEM AND STRUCTURE INSPECTION SUPPORT PROGRAM
To provide a structure inspection support apparatus, a structure inspection support system and a structure inspection support program which clearly show a detection result of a defect spot of a structure.SOLUTION: A structure inspection support apparatus 1 comprises: a storage device which stores a discriminator that receives input of an image of a structure and outputs a probability that a defect exists in each spot of the structure corresponding to each region of the image; and a processing device which executes processing of outputting a defect probability map being data indicating a probability in each region of an image of the designated structure by inputting the image of the designated structure to the discriminator, and processing of correcting the defect probability map by specifying a distortion spot in the image of the designated structure, reducing resolution of a region corresponding to the distortion spot in the output defect probability map on the basis of the specified distortion spot and raising a probability in the region where the resolution is reduced according to a prescribed algorithm.SELECTED DRAWING: Figure 1
【課題】構造物の欠陥箇所の検出結果を明瞭に示す構造物点検支援装置、構造物点検支援システム及び構造物点検支援プログラムを提供する。【解決手段】構造物点検支援装置１は、構造物の画像が入力され、前記画像の各領域に対応する構造物の各箇所に欠陥が存在する確率を出力する識別器を記憶する記憶装置及び指定された構造物の画像を識別器に入力することにより、指定された構造物の画像の各領域における確率を示すデータである欠陥確率マップを出力する処理と、指定された構造物の画像における歪み箇所を特定し、特定した歪み箇所に基づき、出力した欠陥確率マップにおける歪み箇所に対応する領域の解像度を低下させ、解像度を低下させた領域における確率を所定アルゴリズムに従い上昇させることで、欠陥確率マップを修正する処理とを実行する処理装置を備える。【選択図】図１
STRUCTURE INSPECTION SUPPORT APPARATUS, STRUCTURE INSPECTION SUPPORT SYSTEM AND STRUCTURE INSPECTION SUPPORT PROGRAM
To provide a structure inspection support apparatus, a structure inspection support system and a structure inspection support program which clearly show a detection result of a defect spot of a structure.SOLUTION: A structure inspection support apparatus 1 comprises: a storage device which stores a discriminator that receives input of an image of a structure and outputs a probability that a defect exists in each spot of the structure corresponding to each region of the image; and a processing device which executes processing of outputting a defect probability map being data indicating a probability in each region of an image of the designated structure by inputting the image of the designated structure to the discriminator, and processing of correcting the defect probability map by specifying a distortion spot in the image of the designated structure, reducing resolution of a region corresponding to the distortion spot in the output defect probability map on the basis of the specified distortion spot and raising a probability in the region where the resolution is reduced according to a prescribed algorithm.SELECTED DRAWING: Figure 1
【課題】構造物の欠陥箇所の検出結果を明瞭に示す構造物点検支援装置、構造物点検支援システム及び構造物点検支援プログラムを提供する。【解決手段】構造物点検支援装置１は、構造物の画像が入力され、前記画像の各領域に対応する構造物の各箇所に欠陥が存在する確率を出力する識別器を記憶する記憶装置及び指定された構造物の画像を識別器に入力することにより、指定された構造物の画像の各領域における確率を示すデータである欠陥確率マップを出力する処理と、指定された構造物の画像における歪み箇所を特定し、特定した歪み箇所に基づき、出力した欠陥確率マップにおける歪み箇所に対応する領域の解像度を低下させ、解像度を低下させた領域における確率を所定アルゴリズムに従い上昇させることで、欠陥確率マップを修正する処理とを実行する処理装置を備える。【選択図】図１
STRUCTURE INSPECTION SUPPORT APPARATUS, STRUCTURE INSPECTION SUPPORT SYSTEM AND STRUCTURE INSPECTION SUPPORT PROGRAM
構造物点検支援装置、構造物点検支援システム、及び構造物点検支援プログラム
SAKIMURA SHIGEHISA (author) / KAGEYAMA KOJI (author) / GOTO MASAHIRO (author)
2024-02-01
Patent
Electronic Resource
Japanese
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