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Measurement Method, Measurement Device, Measurement System, And Measurement Program
A measurement method includes: generating second measurement data by performing filter processing on first measurement data; calculating a first deflection amount based on an approximate equation of deflection of a structure; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount; calculating a first dynamic response by subtracting the static response from the first measurement data; calculating a second dynamic response by attenuating an unnecessary signal from the first dynamic response; and calculating an attenuation rate of the second dynamic response based on an envelope amplitude of the second dynamic response.
Measurement Method, Measurement Device, Measurement System, And Measurement Program
A measurement method includes: generating second measurement data by performing filter processing on first measurement data; calculating a first deflection amount based on an approximate equation of deflection of a structure; calculating a second deflection amount by performing filter processing on the first deflection amount; calculating a third deflection amount based on the second deflection amount and a first-order coefficient and a zero-order coefficient which are calculated based on the second measurement data and the second deflection amount; calculating an offset based on the zero-order coefficient, the second deflection amount, and the third deflection amount; calculating a static response by adding the offset and a product of the first-order coefficient and the first deflection amount; calculating a first dynamic response by subtracting the static response from the first measurement data; calculating a second dynamic response by attenuating an unnecessary signal from the first dynamic response; and calculating an attenuation rate of the second dynamic response based on an envelope amplitude of the second dynamic response.
Measurement Method, Measurement Device, Measurement System, And Measurement Program
KOBAYASHI YOSHIHIRO (author)
2023-01-05
Patent
Electronic Resource
English
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