Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Quantum mechanical capacitance in a scanning tunneling microscope

    New search for: D. Botkin
    New search for: S. Weiss
    New search for: D. F. Ogletree
    New search for: M. Salmeron
    New search for: D. S. Chemla

    The nature of the ultrafast response of the tunnel junction in a scanning tunneling microscope is discussed.

    Access

    Access via TIB
    Check availability in my library

    Access

    Access via TIB
    Check availability in my library

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Quantum mechanical capacitance in a scanning tunneling microscope

    New search for: D. Botkin
    New search for: S. Weiss
    New search for: D. F. Ogletree
    New search for: M. Salmeron
    New search for: D. S. Chemla

    The nature of the ultrafast response of the tunnel junction in a scanning tunneling microscope is discussed.

    Access

    Access via TIB
    Check availability in my library

    Quantum mechanical capacitance in a scanning tunneling microscope

    New search for: D. Botkin
    New search for: S. Weiss
    New search for: D. F. Ogletree
    New search for: M. Salmeron
    New search for: D. S. Chemla

    The nature of the ultrafast response of the tunnel junction in a scanning tunneling microscope is discussed.

    Access

    Access via TIB
    Check availability in my library

    Access

    Access via TIB
    Check availability in my library

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Quantum mechanical capacitance in a scanning tunneling microscope

    Contributors:

    D. Botkin (author) / S. Weiss (author) / D. F. Ogletree (author) / M. Salmeron (author) / D. S. Chemla (author)

    Publication date:

    1995

    Size:

    8 pages

    Type of media:

    Report

    Type of material:

    No indication

    Language:

    English

    Keywords:

    Optics & Lasers , Laboratory & Test Facility Design & Operation , Microscopes , Semiconductor Junctions , Capacitance , MIM Junctions , Microscopy , Quantum Mechanics , Tunnel Effect , EDB/440600 , EDB/661100

    Similar titles

    Scanning Tunneling Microscope - Atomic Force Microscope

    Masuda, H. | British Library Online Contents | 1993

    Photon scanning tunneling microscope

    T. L. Ferrell / J. P. Goudonnet / R. C. Reddick et al. | NTIS | 1990

    Scanning tunneling microscope at low temperatures

    Marti, Othmar Josef | UB Braunschweig | 1986

    Scanning Tunneling Microscope Studies of Surface Defects

    T. Engel / K. E. Johnson | NTIS | 1991

    High-speed imaging with the scanning tunneling microscope

    Bryant, Andres | TIBKAT | 1986

    Back to top