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    SPECIAL ISSUE PAPERS - Image and Information Processing - Echelon Approach to Characterize and Understand Spatial Structures of Change in Multitemporal Remote Sensing Imagery

    New search for: Smits, P.C.
    New search for: Myers, W.L.

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    SPECIAL ISSUE PAPERS - Image and Information Processing - Echelon Approach to Characterize and Understand Spatial Structures of Change in Multitemporal Remote Sensing Imagery

    New search for: Smits, P.C.
    New search for: Myers, W.L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    SPECIAL ISSUE PAPERS - Image and Information Processing - Echelon Approach to Characterize and Understand Spatial Structures of Change in Multitemporal Remote Sensing Imagery

    New search for: Smits, P.C.
    New search for: Myers, W.L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    SPECIAL ISSUE PAPERS - Image and Information Processing - Echelon Approach to Characterize and Understand Spatial Structures of Change in Multitemporal Remote Sensing Imagery

    Contributors:

    Smits, P.C. (author) / Myers, W.L.

    Published in:

    IEEE transactions on geoscience and remote sensing ; 38

    Publication date:

    2000

    ISSN:

    0196-2892

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Keywords:

    Fernerkundung , Zeitschrift , Messtechnik , Elektronik , Geowissenschaften

    Classification:

    Local classification TIB:  770/3710/5670
    BKL:  38.03 Methoden und Techniken der Geowissenschaften / 74.41 Luftaufnahmen, Photogrammetrie

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