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    Opportunities in the Commercial Use of Remote Sensing and GIS Technologies: An Overview of NASA's Visiting Investigator Program at Stennis Space Center

    New search for: Davis, Bruce A.
    New search for: Carr Jr, Hugh V.
    New search for: Schmidt, Nicholas
    New search for: Hickerson, Logan

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    Opportunities in the Commercial Use of Remote Sensing and GIS Technologies: An Overview of NASA's Visiting Investigator Program at Stennis Space Center

    New search for: Davis, Bruce A.
    New search for: Carr Jr, Hugh V.
    New search for: Schmidt, Nicholas
    New search for: Hickerson, Logan

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Opportunities in the Commercial Use of Remote Sensing and GIS Technologies: An Overview of NASA's Visiting Investigator Program at Stennis Space Center

    New search for: Davis, Bruce A.
    New search for: Carr Jr, Hugh V.
    New search for: Schmidt, Nicholas
    New search for: Hickerson, Logan

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Opportunities in the Commercial Use of Remote Sensing and GIS Technologies: An Overview of NASA's Visiting Investigator Program at Stennis Space Center

    Contributors:

    Davis, Bruce A. (author) / Carr Jr, Hugh V. / Schmidt, Nicholas / Hickerson, Logan

    Published in:

    Photogrammetric engineering & remote sensing ; 59

    Publication date:

    1993

    ISSN:

    0099-1112

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Keywords:

    Geodäsie , Zeitschrift , Fernerkundung , Fotogrammetrie , Geoinformation , Satellitengeodäsie

    Classification:

    BKL:  74.41 / 38.03 Methoden und Techniken der Geowissenschaften / 74.41 Luftaufnahmen, Photogrammetrie / 38.03
    Local classification TIB:  770/3220
    RVK:  RA 4132.

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